Negative bulk modulus and possibility of loss of elastic stability near tricritical transitions in thin films on substrates
نویسندگان
چکیده
Negative bulk modulus and possibility of loss of elastic stability near tricritical transitions in thin films on substrates A. P. Levanyuk, S. A. Minyukov & I. B. Misirlioglu To cite this article: A. P. Levanyuk, S. A. Minyukov & I. B. Misirlioglu (2016) Negative bulk modulus and possibility of loss of elastic stability near tricritical transitions in thin films on substrates, Ferroelectrics, 500:1, 116-128, DOI: 10.1080/00150193.2016.1236608 To link to this article: http://dx.doi.org/10.1080/00150193.2016.1236608
منابع مشابه
A Finite Element Model for Martensitic Thin Films
A finite element approximation of the thin film limit for a sharp interface bulk energy for martensitic crystals is given. The energy density models the softening of the elastic modulus controlling the low-energy path from the cubic to the tetragonal lattice, the loss of stability of the tetragonal phase at high temperatures and the loss of stability of the cubic phase at low temperatures, and ...
متن کاملMechanical Properties of Evaporated Gold Films. Hard Substrate Effect Correction
Nanoindentation tests using the Berkovich indenter tip were performed on 50 and 200 nm thick polycrystalline gold films deposited on hard substrates. Gold film hardness increased with the indentation depth due to the influence of the substrate. A procedure based on the Joslin-Oliver method was introduced to correct for the substrate effect. The method utilizes the fact that the measured elastic...
متن کاملNano-indentation of Copper Thin Films on Silicon Substrates
Indentation methods are finding increasing use in the study of mechanical properties of bulk and thin-film materials over a wide range of size scales (e.g., [1,2]). With the increasing sophistication of instrumented, depth-sensing indentation equipment and of computational methods to model the deformation of materials subjected to indentation, there is growing interest in studying the elastopla...
متن کاملPreparation and Characterization of Aluminum Nitride Thin Films with the Potential Application in Electro-Acoustic Devices
In this work, aluminum nitride (AlN) thin films with different thicknesses were deposited on quartz and silicon substrates using single ion beam sputtering technique. The physical and chemical properties of prepared films were investigated by different characterization technique. X-ray diffraction (XRD) spectra revealed that all of the deposited films have an amorphous str...
متن کاملSol – Gel Spin Coated Cadmium Sulphide Thin Films on Silicon (1 0 0) Substrates for Optoelectronic Applications
Cadmium chalcogenides with appropriate band gap energy have been attracting a great deal of attention because of their potential applications in optoelectronic devices. In this work CdS thin films were deposited on p – type silicon substrates by sol – gel spin coating method at different substrate temperatures. The CdS deposited wafers were characterized by X‐ray diffracti...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2016